Lei HUANG

Brookhaven National Laboratory
United States of America

Biography
Lei Huang graduated from Sichuan University and Tianjin University in China. He got his Ph.D. degree in optical metrology from Nanyang Technological University ( Singapore ) . After that, as a postdoc, he join ed NSLS - II optical metrology group at Brookhaven National Laboratory in the US . Lei is currently working as a metrology scientist in the optical metrology group at NSLS - II , BNL . Generally, h is research area includes optic al metrology and optical fabrication. His research work mainly focused on developing optical three - dimensional metrology techniques for industrial and scientific applications.

At Brookhaven , h is main research effort is to develop metrology instruments for synchrotron mirror inspection with various optical metrology solutions . For the ex situ metrology applications, Lei works on the stitching interferometry and the scanning deflectometry for the X - ray optics characterization in the optical metrology lab . For the in situ metrology, he uses at - wavelength m etrology tools like X - ray wavefront sensor to diagnose the imperfection and al ignment of the X - ray optics at synchrotron beamline s . He also works on data analysis algorithms to evaluate the figure residual from its target shape